Past webinars

[White light interference x focus variation, from sub-nano level surface roughness to milli level profile]
Tokyo Seimitsu has cultivated know-how of surface roughness measurements for many years since developing stylus-type surface roughness measuring instruments in 1962. Based on that know-how and developed as a “contactless surface roughness measuring instrument,” we introduce the “Opt-scope” 3D white light interference microscope which has been introduced and is well-received by numerous customers.
[Product Features]
The “Opt-scope” is a measuring device that can evaluate - to a high precision and high resolution using the white light interference method - 3D shapes such as the nanometer and sub-nanometer level surface roughness of semiconductor wafers, and the static electric chuck that holds that wafer. Furthermore, one “Opt-scope” unit can answer a variety of your measurement needs as we have added the new option, “the focus variation measurement feature,” that enables measurement of shapes at the millimeter level such as gears including steep inclines, which was previously difficult with the white light interference method.

We recommend it to the following people! (Speaker’s comment) In this seminar, a demonstration with an actual device of the surface texture and contour measuring instruments was mixed in, and the appeal of the “Opt-scope” was introduced in a live format. Those who are interested in evaluating surface properties and contour shapes without contact, by all means take part.

In this seminar, we introduce the ZEISS O-INSPECT, a multi-sensor measurement device that can help make your company’s inspections more efficient.
The ZEISS O-INSPECT is a multi-sensor measurement device equipped with a scanning probe and an image probe. On this occasion, we will give a live demo of a measurement solution including the ZEISS VAST probing (ZVp) with new features that further increase the measurement speed.
Enter a new dimension in this webinar by experiencing the ZEISS O-INSPECT, a product beyond the bounds of conventional image measurement devices.

We recommend it to the following people! (Speaker’s comment) In this webinar, you can watch a live demo including examples of a variety of applications using the multi-sensors. Also, on this occasion, the new ZEISS VAST Probing (ZVp) feature that is available with the ZEISS O-INSPECT dramatically increases the measurement speed. Watch an actual Zvp measurement, and experience the overwhelming speed of the measurement.

This is our answer for enabling high-speed and high-precision measurements that can evaluate the dimensional and geometric tolerance of shaft-profiled workpieces efficiently and with no contact. The online seminar introduces Shaftcom, which optically measures cylindrical component dimensions and contours quickly within the production line and also allows measuring into inner diameters and keyways using a contact probe sensor (optional).

This presentation is a must-see for those manufacturing rotating machine elements. It showcases the basic features of Shaftcom, as well as what makes it exceptional. We urge you to come see the appeal of Shaftcom with its ability to perform ultra-high-speed measurements alongside high-precision evaluations.

ZEISS is an expert in the field of CT technology, having provided the METROTOM family of highly-reliable CT systems for over a decade. Allowing inspection of hidden areas all at once, the newest product in their lineup enables the inspection of a large variety of components, including plastic connectors and caps, aluminum products, and products both medium-sized and small. This online seminar introduces how the new X-ray CT system ZEISS METROTOM 1 enables a new level of simplicity.

An entry model METROTOM X-ray CT measurement machine has now arrived. It excels at scanning and measuring multiple small-sized aluminum or plastic workpieces at once. Its compact body is great for those who lack the space for other models.

We introduce our new products and automated systems exhibited at JIMTOF2022. These focused on measurement solutions best suited for the automotive industry, which is undergoing a remarkable shift to xEVs, and the aircraft industry which is expected to grow in the future.

We recommend it to the following people! (Speaker’s comment) At JIMTOF2022, we exhibited groundbreaking new products that surpassed conventional measurement devices, and we received a lot of feedback. Those who were not able to attend the venue this time, and those who are interested in the products and services provided by Tokyo Seimitsu Group, and want to know the details of the measurement trends in leading edge fields such as aircrafts, EV, medical devices, and semiconductors, by all means watch it.

Part 1: Automation and Labor Saving Solutions​
Introducing of One Stop Solution proposed by Tokyo Seimitsu from concept to design, installation, operation and follow-up.​
Part 2: Metrology solution for after support, maintenance and upgrade​
We provide total support for the daily measurement operations of customers who have chosen Tokyo Seimitsu products, from careful inspection, repair and maintenance by our skilled service staff to the introduction of accessories. Even if your measurement needs change, our “Upgrade Service” will provide you with the best measurement solution by adding new functions and specifications to meet your needs.

This is ideal for those wanting even better inspection efficiency when using precision measuring devices such as CMMs, or those who already own an ACCRETECH measuring systems and are looking for further stability or other effective uses. This webinar is split into two sections, with the first half covering automation and labor-saving measurement solutions and the second half covering after-sales support solutions. The first half has been updated from last year’s webinar to include a demonstration using an actual machine and examples of designated jigs created to allow automation. The second half presents various full-year maintenance plans newly offered by the ACCRETECH Group, inspection and calibration services offered on various schedules, and retrofitting availability.

Tokyo Seimitsu introduces as soon as possible the trends in the latest ISO texture standard.

We recommend it to the following people! (Speaker’s comment) This is useful information for measurements conforming to the new JIS standards that will be revised in the future, including an introduction to surface texture, the revised points in the new surface properties international standard, ISO 21920, issued in 2021, and the outline of the surface properties parameters in the new standard. By all means watch this webinar, and do not hesitate to contact us to clarify any unclear points.

The expanding global aircraft market demands authentication and certification based on international standards, as well as stringent quality control of components. In recent years, measuring technology cultivated by ACCRETECH has supported everything from the development to the production of aircraft components, including engine components, which are improving in performance. This online seminar will focus on engine cases, shafts, blades, and blisks, and will propose measurement issues and solutions.

Machine tools are a familiar and intimate part manufacturing. But what is the best way to assure accuracy in dimension and profile? With a caliper? A micrometer? A measuring profile projector? Or perhaps with non-contact measurement. One by one, we will present some common customer issues and propose the best solution for each.

The expanding global aircraft market demands authentication and certification based on international standards, as well as stringent quality control of components. In recent years, measuring technology cultivated by ACCRETECH has supported everything from the development to the production of aircraft components, including engine components, which are improving in performance. This online seminar will focus on engine cases, shafts, blades, and blisks, and will propose measurement issues and solutions.

This is a showcase of the latest measurement functions intended for aircraft engine components, with actual machine demonstrations showing new functions such as the non-contact sensor. The webinar is designed to be informative regardless of whether you handle aircraft components or not. In addition, the XYZAX Opt-BLISK, which combines a newly developed non-contact rotary probe with the high-acceleration CMM XYZAX AXCEL, enables improved speed that reduces the time required to evaluate blisks down to 60% compared to conventional devices. Please take a look to get a visual sense of the machine’s characteristics and how it works.

ZEISS METROTOM is a dimensional X-ray CT that distinguishes itself from previous observational X-ray CTs by featuring individual axis control technology nurtured with CMMs, an ultra-high-accuracy positioning stage, a high-resolution flat panel detector, and CALYPSO CT software. In addition to non-destructive inspections such as structural analysis, functional inspection, and defect analysis, ZEISS METROTOM offers many optimal solutions, from structural comparison of the internal shape of complex industrial product (e.g. resin moldings, aluminum die casts) to high-precision measurement of internal and external dimensions. Please take this opportunity to see the latest solutions delivered LIVE from our showroom in front of METROTOM.

This webinar presents the new ZEISS METROTOM model that can scan bigger areas than before despite its reduced footprint. It is ideal for those who wish to measure and evaluate internal structures and multiple other areas all at once in large aluminum or plastic products.

Tokyo Seimitsu's Opt-scope series of non-contacted 3D surface roughness and contour measuring instruments for measuring nano-level surface properties are equipped with the company's original peak detection algorithm DEAP. The newly added model Opt-scope Rex, a large type for special applications, not only provides highly accurate measurement, but also enables evaluation of a wider range of surface properties by extending the drive range of the motorized XY stage to 400 mm square (maximum 600 mm square). It is applicable for the measurement of semiconductors, semiconductor manufacturing equipment parts, molds, etc., where the size of the workpiece tends to be large. This seminar will focus on the new Opt-scope Rex and introduce its measurement principle, comparison with other measurement principles, new functions, and actual application examples.

This webinar introduces a larger model for Opt-scope, the measuring machine that uses white light interference microscopy for measurements in the order of millimeters with nano-level accuracy. It accommodates measurement applications for automotive, medical, electric, wafer, and semiconductor manufacturing components. The webinar is ideal for those who are currently using or considering a non-contact microscope type measuring machine.

In this seminar, we will introduce the latest measuring machines, RONDCOM NEX/SURFCOM NEX, aimed at helping you improve inspection efficiency. RONDCOM NEX is a roundness and cylindrical profile measuring machine with various functions such as roundness and surface roughness measurement, and a new detector that can automatically switch between roundness and diameter measurement. In addition, an XY axis automatic stage can be equipped, which helps reduce labor required for inspections through the automatic continuous measurement of multiple workpieces and multiple locations. SURFCOM NEX not only has an overwhelming drive speed, but also features a newly developed wide-range hybrid detector that can evaluate a broad spectrum of surface roughness and contour profiles in a short time and with a single trace. If you are aiming to carry out inspections faster and hassle-free, please be sure to take a look at RONDCOM NEX/SURFCOM NEX, as these measuring machines will surely meet your needs.

This webinar is ideal for those looking to automate or save on manpower with a roundness measuring instrument. Consecutive measuring using an XY axis auto stage and multi-measurement using new detectors are some of the features that reduce the labor load for operators and improve efficiency. Upgrades are also available, so we encourage those who already have the product to take a look as well.The information provided is perfect for those hoping to reduce takt times and improve efficiency in inspection processes that use surface roughness and contour measuring. We present the strengths of our latest measuring machine not only in terms of performance but also in terms of usability and serviceability.

While the global mold market has continued to grow since the financial crisis caused by the collapse of Lehman Brothers, demands relating to the precision, delivery time, and cost of molds have been intensifying. In particular, the issues of “complex and high-precision molds, short delivery time,” “cost reduction responding to global market competition,” and “quantitative evaluation to secure new human resources and inherit technology due to the aging of engineers" must be addressed in the market overall. In this webinar, we will introduce application examples that can solve these problems under the theme of "Problems and Solutions for Quality Control in Mold Production."

This webinar presents mold-related solutions by task type. Our proposals draw on the latest measuring machines, functions, sensors, and software to solve a range of customer issues.

Developed in line with a concept of “All in the Document,” ACCTee is an integrated measurement and analysis software capable of performing all operations on a document while not only offering high operability and productivity but also functional scalability. In this seminar, we will introduce the basic functions and features of ACCTee for those who are considering introducing measuring machines in the future. In addition, we will introduce useful functions as reference for those who already have a measuring machine and are using ACCTee.

This webinar introduces the basic features of ACCTee, the integrated analysis software for surface roughness, contour, and roundness measuring machines, as well as the functions that aid measuring in each machine type. If you are interested in seeing how the software operates or you are considering an upgrade from previous software, we encourage you to watch this webinar to see why we recommend ACCTee.

ZRE (ZEISS REVERSE ENGINEERING) is a software that creates and corrects 3D CAD models based on measurement data. It features high-precision reverse engineering and an innovative “Tool Correction” function which quantifies and streamlines mold corrections. Using a simple procedure, ZRE can generate surfaces directly from point cloud data of both contact and non-contact measurement results. In addition, this software quantifies the amount of mold correction that operators conventionally adjusted based on their intuition alone. This makes it is possible to minimize the trial-and-error process of correction based on measurement results and efficiently perform mold correction. Utilizing the actual user interface for easy understanding, this webinar will cover the key points of innovative reverse engineering functions, as well as problems related to mold correction and the solutions thereof.

Zeiss Reverse Engineering (ZRE) is software that will meet your reverse engineering needs. It can generate 3D CAD models from measuring data, with optional additions such as a proprietary mold correction function or a function that calculates cylinder piston capacity. This webinar provides explanations showing the actual user interface to give a good sense of how the software works.

CALYPSO is a standard metrology software equipped with a CAD kernel that pursues the ultimate in functionality and operability. This time, the latest version of CALYPSO will be launched with groundbreaking new features. In this seminar, we will introduce the prominent functions of CALYPSO using the actual user interface, along with tips for efficient measurement planning. We will also introduce various options to further improve operator performance, such as automatic generation of travel paths, collisions checking with a simulation function, as well as reference and statistical analysis of measurement results using ZEISS PiWeb reporting Plus, a reporting engine with excellent operability and an abundance of functions.

This webinar presents the versatile measurement software application CALYPSO, introducing its latest functions and the features that make it easy to use. We present information that benefits both those who are already using the software and those who are considering it, with practical demonstrations for easier understanding. The presentation is perfect for customers hoping to improve efficiency with an offline teaching function.

Are you using two different machines to measure surface texture and contour? Or perhaps you are measuring these simultaneously on the same measuring instrument, but the range is too narrow, and it's causing you headaches? SURFCOM NEX is the latest surface texture and contour measuring instrument solving issues such as these. This webinar introduces SURFCOM NEX, which will undoubtedly be useful in your inspections thanks to its high efficiency, high versatility, and high reliability.

This is ideal for those just getting into inspection and are curious to know what surface roughness is and why it needs to be managed, as well as those who already use surface roughness or contour measuring instruments but are hoping to improve measurement efficiency.The webinar is split into two sections, with the first half featuring one of our experienced sales managers explaining the basics of surface roughness and the importance of managing it with a measuring instruments. The second half features a group leader of our surface roughness/contour measuring instruments business introducing our new SURFCOM NEX product.SURFCOM NEX was officially released in July 2021, half a year after this webinar. Very soon after in September, the developer introduced the product in more detail in another webinar, which we encourage you to watch as well.

ACCRETECH leverages its measuring technologies to help solve concrete issues in both the medical and semiconductor industries. Here, we introduce how are measuring solutions are applied using catheters for endovascular treatment and blood circuits for dialysis as examples of medical devices, and electrostatic chucks (ESC), which are the electrostatic adsorption mechanism for semiconductor wafers, as examples of semiconductor manufacturing equipment.

The first half of the webinar covers medical instruments with a look at injection needle hubs, three-way stopcocks, syringes, and catheters. The second half covers semiconductor manufacturing devices with a look at electrostatic chucks. With actual customer example that made use of our products, we present our measurement solutions with actual workpieces as easily understandable visual aids. The information provided is ideal for those manufacturing related products.

ZEISS CONTURA is a high-performance coordinate measuring machine by Carl Zeiss offering absolute diversity and flexibility. Equipped with ZEISS’s multi application sensor system (mass) technology, it supports all kinds of applications while swiftly and easily switching between various sensor technologies. This CMM enables you to be prepared from now and in the future for the measurement requirement. This webinar introduces ZEISS CONTURA as a multi-tool instantly adapting to customers’ ever-changing requests.

This webinar is ideal for those looking for information on the latest CMMs, as well as those considering an upgrade from a previous model. We also present contact and non-contact sensor technology as well as new functions that improve measurement efficiency and reduce measurement time, which should be of interest to quality assurance representatives looking to make effective use of CMMs.

ZEISS O-DETECT is a new member of the ZEISS Optical Series. The new ZEISS O-DETECT is equipped with a high-accuracy digital zoom camera, INVENTA D1, and despite being a machine that measures using an image sensor alone, it is a level above conventional image measuring equipment due to its ability to guarantee length measurement error MPE_E(in 3D). This webinar introduces Optical products, which are a fusion of Carl Zeiss optical technology boasting a long-established tradition, and reliable industrial measuring technology. The webinar also presents some examples of these products in use.

This webinar introduces optical measuring solutions from ZEISS. ZEISS O-DETECT is an optical measurement machine with guaranteed three-dimensional length precision that can be used to evaluate offset hole pitches. ZEISS O-INSPECT is a multi-sensor CMM fitted with both a tactile scanning probe and an optical probe that can do the job of several conventional measuring machines in one.Come experience new-level ZEISS optical solutions that go beyond the boundaries of conventional optical measuring machines.