Tokyo Seimitsu to Exhibit at JIMTOF2024
2024-11-1
Tokyo Seimitsu Co., Ltd. will exhibit at JIMTOF2024, that will be held at Tokyo Big Sight (Tokyo, Japan) from November 5 (Tuesday) to 10 (Sunday), 2024.
With the slogan “Experience the Accretech Value,” we will provide a valuable venue at the exhibition where you can experience the products and services of the Tokyo Seimitsu Group that match your measurement needs.
We will also introduce a wide variety of applications for xEVs (electric vehicles). Particularly we will exhibit a number of new products and measurement automation packages, with a focus on optimal measurement solutions for the production of core components of electric vehicles (EVs) such as eAxle, battery, and electronics.
Main exhibit machines
"Opt-scope NEX" series
Regardless of the lens magnification, a high resolution of 0.01 nm is uniformly achieved in the vertical direction.
In addition, the surface properties of nano-particles can be measured using a low magnification lens, and a one-shot high-speed measurement that covers a wide range of area is enabled.
The new "Opt-scope NEX" series lineup includes the all-in-one floor installation DX type and the desktop SD type, which are capable of flexibly handling all types of workpieces and allows you to work without any stress.
Shaftcom Automation/labor-saving system
Tokyo Seimitsu's automation and labor-saving measurement solutions have been integrated into the Shaftcom optical shaft measuring system, which is capable of high-speed, high-precision measurement.
Shaftcom
Optical shaft measuring system that achieves "high speed" and "high precision" measurement and can be automated on the shop floor.
The dimensional tolerance and geometrical tolerance of a shaft-shaped workpiece can be evaluated in a short amount of time.
ZEISS DuraMax®
The ZEISS technologies concentrated in a compact body.
Slim and space-saving coordinate measuring machine for on-site measurement.
Enabled support for automation and labor saving.
ZEISS CONTURA® RDS
Combined use of multiple measurement sensors enabled
ZEISS CONTURA® RDS is equipped with the mass (multi-application sensor system) technology that can handle all types of measurement both in contact and non-contact modes, allowing you to use just a single device for all types of measurement.
| Event dates | 2024-11-5(Tue) to 2024-11-10(Sun) |
|---|---|
| venue | TOKYO BIG SIGHT |
| Booth No. | exhibition hall：East Hall 7 Booth number：E7027 |
| Official site | https://www.jimtof.org/en/index.html |