For measurement of nano / sub-nano level surface roughness.
3D white light interferometer microscope
New Option！Focus variation measurement function enables high-speed millimeter shape measurement.
The focus variation measuring function is based on the focus variation microscopy, a measurement method specified in ISO 25178-6:2010 (an international standard for 3-dimensional surface texture), enabling the measurement of millimeter-order contour, including slopes of high angles, which was difficult to perform with the white light interferometry. With the addition of this new focus variation measuring function, together with the conventional white-light interferometry, Opt-Scope can now meet an even wider variety of measurement needs.
3D white light interference microscope Opt-scope of high resolution, wide range and high speed
Opt-scope is a 3D white light interference microscope with a high vertical resolution of 0.01nm irrespective of the lens magnification. Because of its ability to measure nano surface profile with a low magnification lens, it can perform high-speed, wide-range measurement in one shot. Sub-nano surface roughness, transparent objects and high aspect ratio structures that cannot be measured by laser microscope or other non-contact measuring instruments can be measured by Opt-scope at a high repeatability.
Opt-scope has a lineup for different sizes of workpieces,and can be customized upon request
Opt-socpe has a lineup according to the work piece size.
Standard type R with a choice of 25 mm square and 50 mm square drive range for the electric XY stage, 200 mm square R200,
And a special large type Rex that can be expanded from 400 mm square to a maximum of 600 mm square has been newly added to the lineup.It can be used for measuring semiconductors, semiconductor manufacturing equipment, molds, etc., which have many large workpieces.
High correlation with stylus type
Tokyo Seimitsu has been selling stylus type surface roughness measuring machines for many years as a market leader, and Opt-scope has a correlation with the stylus type measurement results.
Compliant with ISO 25178-2 and JIS B 0681-2 3D Surface Texture Parameters
As a long-time member of ISO/TC213, Tokyo Seimitsu has been involved in the dissemination and promotion of 3D surface texture measurement.
Scanning speed increased by 6 times with the Optional high-speed camera
Two mode options according to accuracy requirement, making the high-speed mode achieve even a higher speed .
Film thickness analysis with transparent multilayer film measurement function
For multilayer film can be stacked up to 6 transparent layers of 1.5 μm or more in optical length (7 interfaces). The function is able to analyze the surface texture of the topmost surface, film thickness of each layer and film thickness distribution.
Evaluation and Analysis